Layer Error Characteristics of Lattice-Reduction Aided V-Blast Detectors - researchr publication authors

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Tien Duc Nguyen, Xuan Nam Tran, Tadashi Fujino. Layer Error Characteristics of Lattice-Reduction Aided V-Blast Detectors. In Proceedings of the IEEE 17th International Symposium on Personal, Indoor and Mobile Radio Communications, PIMRC 2006, 11-14 September 2006, Helsiniki, Finland. pages 1-5, IEEE, 2006. [doi]

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