Tien Duc Nguyen, Xuan Nam Tran, Tadashi Fujino. Layer Error Characteristics of Lattice-Reduction Aided V-Blast Detectors. In Proceedings of the IEEE 17th International Symposium on Personal, Indoor and Mobile Radio Communications, PIMRC 2006, 11-14 September 2006, Helsiniki, Finland. pages 1-5, IEEE, 2006. [doi]
@inproceedings{NguyenTF06-0, title = {Layer Error Characteristics of Lattice-Reduction Aided V-Blast Detectors}, author = {Tien Duc Nguyen and Xuan Nam Tran and Tadashi Fujino}, year = {2006}, doi = {10.1109/PIMRC.2006.254349}, url = {http://dx.doi.org/10.1109/PIMRC.2006.254349}, researchr = {https://researchr.org/publication/NguyenTF06-0}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {Proceedings of the IEEE 17th International Symposium on Personal, Indoor and Mobile Radio Communications, PIMRC 2006, 11-14 September 2006, Helsiniki, Finland}, publisher = {IEEE}, }