Adversarially-Regularized Mixed Effects Deep Learning (ARMED) Models Improve Interpretability, Performance, and Generalization on Clustered (non-iid) Data

Kevin P. Nguyen, Alex H. Treacher, Albert Montillo. Adversarially-Regularized Mixed Effects Deep Learning (ARMED) Models Improve Interpretability, Performance, and Generalization on Clustered (non-iid) Data. IEEE Trans. Pattern Anal. Mach. Intell., 45(7):8081-8093, July 2023. [doi]

Abstract

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