Chao Ni, Wei Wang 0087, Kaiwen Yang, Xin Xia 0001, Kui Liu, David Lo 0001. The best of both worlds: integrating semantic features with expert features for defect prediction and localization. In Abhik Roychoudhury, Cristian Cadar, Miryung Kim, editors, Proceedings of the 30th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/FSE 2022, Singapore, Singapore, November 14-18, 2022. pages 672-683, ACM, 2022. [doi]
Abstract is missing.