Tianming Ni, Hao Chang, Tai Song, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan, Xiaoqing Wen. Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC. IEEE Trans. on Circuits and Systems, 67-II(11):2657-2661, 2020. [doi]
Abstract is missing.