Qing Ni, Xin Luo, Ran Tao 0005, Youqun Shi. Lightweight Fabric Defect Detection Based on Improved YOLOv4. In Proceedings of the 9th International Conference on Computing and Artificial Intelligence, ICCAI 2023, Tianjin, China, March 17-20, 2023. pages 288-294, ACM, 2023. [doi]
Abstract is missing.