Learning with Guaranteed Label Quality

Eileen A. Ni, Charles X. Ling. Learning with Guaranteed Label Quality. In Xue-wen Chen, Tharam S. Dillon, Hisao Ishbuchi, Jian Pei, Haixun Wang, M. Arif Wani, editors, 10th International Conference on Machine Learning and Applications and Workshops, ICMLA 2011, Honolulu, Hawaii, USA, December 18-21, 2011. Volume 1: Main Conference. pages 490-495, IEEE Computer Society, 2011. [doi]

@inproceedings{NiL11-1,
  title = {Learning with Guaranteed Label Quality},
  author = {Eileen A. Ni and Charles X. Ling},
  year = {2011},
  doi = {10.1109/ICMLA.2011.88},
  url = {http://doi.ieeecomputersociety.org/10.1109/ICMLA.2011.88},
  researchr = {https://researchr.org/publication/NiL11-1},
  cites = {0},
  citedby = {0},
  pages = {490-495},
  booktitle = {10th International Conference on Machine Learning and Applications and Workshops, ICMLA 2011, Honolulu, Hawaii, USA, December 18-21, 2011. Volume 1: Main Conference},
  editor = {Xue-wen Chen and Tharam S. Dillon and Hisao Ishbuchi and Jian Pei and Haixun Wang and M. Arif Wani},
  publisher = {IEEE Computer Society},
}