Learning with Guaranteed Label Quality

Eileen A. Ni, Charles X. Ling. Learning with Guaranteed Label Quality. In Xue-wen Chen, Tharam S. Dillon, Hisao Ishbuchi, Jian Pei, Haixun Wang, M. Arif Wani, editors, 10th International Conference on Machine Learning and Applications and Workshops, ICMLA 2011, Honolulu, Hawaii, USA, December 18-21, 2011. Volume 1: Main Conference. pages 490-495, IEEE Computer Society, 2011. [doi]

Abstract

Abstract is missing.