A Region-Based Through-Silicon via Repair Method for Clustered Faults

Tianming Ni, Huaguo Liang, Mu Nie, Xiumin Xu, Aibin Yan, Zhengfeng Huang. A Region-Based Through-Silicon via Repair Method for Clustered Faults. IEICE Transactions, 100-C(12):1108-1117, 2017. [doi]

Abstract

Abstract is missing.