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EXACT: Edge-eXplainable Autonomous Causal Telemetry for Silicon Lifecycle Management

Hsiao-Ping Ni, Eduardo Ortega, Krishnendu Chakrabarty. EXACT: Edge-eXplainable Autonomous Causal Telemetry for Silicon Lifecycle Management. In IEEE European Test Symposium, ETS 2026, Chania, Greece, May 25-29, 2026. pages 1-6, IEEE, 2026. [doi]

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