Chao Ni 0001, Kaiwen Yang, Yan Zhu, Xiang Chen 0005, Xiaohu Yang 0001. Unifying Defect Prediction, Categorization, and Repair by Multi-Task Deep Learning. In 38th IEEE/ACM International Conference on Automated Software Engineering, ASE 2023, Luxembourg, September 11-15, 2023. pages 1980-1992, IEEE, 2023. [doi]
Abstract is missing.