Extended self-similarity based multi-fractal detrended fluctuation analysis: A novel multi-fractal quantifying method

Da Nian, Zuntao Fu. Extended self-similarity based multi-fractal detrended fluctuation analysis: A novel multi-fractal quantifying method. Commun. Nonlinear Sci. Numer. Simul., 67:568-576, 2019. [doi]

Authors

Da Nian

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Zuntao Fu

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