Extended self-similarity based multi-fractal detrended fluctuation analysis: A novel multi-fractal quantifying method

Da Nian, Zuntao Fu. Extended self-similarity based multi-fractal detrended fluctuation analysis: A novel multi-fractal quantifying method. Commun. Nonlinear Sci. Numer. Simul., 67:568-576, 2019. [doi]

Abstract

Abstract is missing.