Michael Nicolaidis. Design for Mitigation of Single Event Effects. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 95-96, IEEE Computer Society, 2005. [doi]
@inproceedings{Nicolaidis05,
title = {Design for Mitigation of Single Event Effects},
author = {Michael Nicolaidis},
year = {2005},
doi = {10.1109/IOLTS.2005.20},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.20},
tags = {design},
researchr = {https://researchr.org/publication/Nicolaidis05},
cites = {0},
citedby = {0},
pages = {95-96},
booktitle = {11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-2406-0},
}