Michael Nicolaidis. GRAAL: a new fault tolerant design paradigm for mitigating the flaws of deep nanometric technologies. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]
Abstract is missing.