Michael Nicolaidis. Finitely self-checking circuits and their application on current sensors. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 66-69, IEEE, 1993. [doi]
@inproceedings{Nicolaidis93-0, title = {Finitely self-checking circuits and their application on current sensors}, author = {Michael Nicolaidis}, year = {1993}, doi = {10.1109/VTEST.1993.313306}, url = {http://dx.doi.org/10.1109/VTEST.1993.313306}, researchr = {https://researchr.org/publication/Nicolaidis93-0}, cites = {0}, citedby = {0}, pages = {66-69}, booktitle = {11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA}, publisher = {IEEE}, isbn = {0-8186-3830-3}, }