Michael Nicolaidis. Scaling Deeper to Submicron: On-Line Testing to the Rescue. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 1139, IEEE Computer Society, 1998. [doi]
@inproceedings{Nicolaidis98:1, title = {Scaling Deeper to Submicron: On-Line Testing to the Rescue}, author = {Michael Nicolaidis}, year = {1998}, url = {http://www.computer.org/proceedings/itc/5093/50931397.pdf}, tags = {testing}, researchr = {https://researchr.org/publication/Nicolaidis98%3A1}, cites = {0}, citedby = {0}, pages = {1139}, booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998}, publisher = {IEEE Computer Society}, isbn = {0-7803-5093-6}, }