Michael Nicolaidis. Design for soft-error robustness to rescue deep submicron scaling. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 1140, IEEE Computer Society, 1998. [doi]
@inproceedings{Nicolaidis98a, title = {Design for soft-error robustness to rescue deep submicron scaling}, author = {Michael Nicolaidis}, year = {1998}, url = {http://www.computer.org/proceedings/itc/5093/50931140.pdf}, tags = {design}, researchr = {https://researchr.org/publication/Nicolaidis98a}, cites = {0}, citedby = {0}, pages = {1140}, booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998}, publisher = {IEEE Computer Society}, isbn = {0-7803-5093-6}, }