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Transparent BIST for ECC-based memory repair

Michael Nicolaidis, Panagiota Papavramidou. Transparent BIST for ECC-based memory repair. In 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013. pages 216-223, IEEE, 2013. [doi]

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