Michael Nicolaidis, Panagiota Papavramidou. Memory repair for high defect densities. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-4, IEEE, 2015. [doi]
@inproceedings{NicolaidisP15,
title = {Memory repair for high defect densities},
author = {Michael Nicolaidis and Panagiota Papavramidou},
year = {2015},
doi = {10.1109/VTS.2015.7116277},
url = {http://dx.doi.org/10.1109/VTS.2015.7116277},
researchr = {https://researchr.org/publication/NicolaidisP15},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7597-6},
}