Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems - researchr publication

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Michael Nicolaidis, Vladimir Pasca, Lorena Anghel. Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems. In 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece. pages 218, IEEE, 2010. [doi]

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