Phil Nigh. Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 1198, IEEE Computer Society, 2002. [doi]
@inproceedings{Nigh02,
title = {Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products},
author = {Phil Nigh},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75431198.pdf},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/Nigh02},
cites = {0},
citedby = {0},
pages = {1198},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}