Atsushi Niida, Seiya Imoto, Teppei Shimamura, Satoru Miyano. Statistical model-based testing to evaluate the recurrence of genomic aberrations. Bioinformatics, 28(12):115-120, 2012. [doi]
@article{NiidaISM12,
title = {Statistical model-based testing to evaluate the recurrence of genomic aberrations},
author = {Atsushi Niida and Seiya Imoto and Teppei Shimamura and Satoru Miyano},
year = {2012},
doi = {10.1093/bioinformatics/bts203},
url = {http://dx.doi.org/10.1093/bioinformatics/bts203},
researchr = {https://researchr.org/publication/NiidaISM12},
cites = {0},
citedby = {0},
journal = {Bioinformatics},
volume = {28},
number = {12},
pages = {115-120},
}