Parastoo Nikaeen, Boris Murmann, Robert W. Dutton. Characterizing the Impact of Substrate Noise on High-Speed Flash ADCs. In 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA. pages 396-400, IEEE Computer Society, 2008. [doi]
Abstract is missing.