Amorphous Metal Oxide Bilayers to Avoid Sneak-Path Currents for High-Density Resistive Memory Arrays

Shruti Nirantar, Md. Ataur Rahman, Edwin Mayes, Madhu Bhaskaran, Sumeet Walia, Sharath Sriram. Amorphous Metal Oxide Bilayers to Avoid Sneak-Path Currents for High-Density Resistive Memory Arrays. Adv. Intell. Syst., 3(6):2000222, 2021. [doi]

@article{NirantarRMBWS21,
  title = {Amorphous Metal Oxide Bilayers to Avoid Sneak-Path Currents for High-Density Resistive Memory Arrays},
  author = {Shruti Nirantar and Md. Ataur Rahman and Edwin Mayes and Madhu Bhaskaran and Sumeet Walia and Sharath Sriram},
  year = {2021},
  doi = {10.1002/aisy.202000222},
  url = {https://doi.org/10.1002/aisy.202000222},
  researchr = {https://researchr.org/publication/NirantarRMBWS21},
  cites = {0},
  citedby = {0},
  journal = {Adv. Intell. Syst.},
  volume = {3},
  number = {6},
  pages = {2000222},
}