Muhammad Mudassar Nisar, Abhijit Chatterjee. Test Enabled Process Tuning for Adaptive Baseband OFDM Processor. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 9-16, IEEE Computer Society, 2008. [doi]
Abstract is missing.