Semantic Metamorphic Testing focusing on Object Rarity

Yasuharu Nishi, Hidenori Ito, Yuma Torikoshi. Semantic Metamorphic Testing focusing on Object Rarity. In IEEE International Conference on Software Testing, Verification and Validation, ICST 2023 - Workshops, Dublin, Ireland, April 16-20, 2023. pages 288-291, IEEE, 2023. [doi]

Authors

Yasuharu Nishi

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Hidenori Ito

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Yuma Torikoshi

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