Yasuharu Nishi, Hidenori Ito, Yuma Torikoshi. Semantic Metamorphic Testing focusing on Object Rarity. In IEEE International Conference on Software Testing, Verification and Validation, ICST 2023 - Workshops, Dublin, Ireland, April 16-20, 2023. pages 288-291, IEEE, 2023. [doi]
@inproceedings{NishiIT23,
title = {Semantic Metamorphic Testing focusing on Object Rarity},
author = {Yasuharu Nishi and Hidenori Ito and Yuma Torikoshi},
year = {2023},
doi = {10.1109/ICSTW58534.2023.00058},
url = {https://doi.org/10.1109/ICSTW58534.2023.00058},
researchr = {https://researchr.org/publication/NishiIT23},
cites = {0},
citedby = {0},
pages = {288-291},
booktitle = {IEEE International Conference on Software Testing, Verification and Validation, ICST 2023 - Workshops, Dublin, Ireland, April 16-20, 2023},
publisher = {IEEE},
isbn = {979-8-3503-3335-0},
}