Yoshifumi Nishi, Sebastian Schmelzer, Ulrich Bottger, Rainer Waser. Weibull analysis of the kinetics of resistive switches based on tantalum oxide thin films. In Proceedings of the European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, Romania, September 16-20, 2013. pages 174-177, IEEE, 2013. [doi]
Abstract is missing.