A fault-tolerant combinational circuit with fault diagnosis capability - To mask and detect the loss of any one connection between gate circuits - researchr publication authors

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Masakatsu Nishigaki, Makoto Nakano, Masakazu Soga. A fault-tolerant combinational circuit with fault diagnosis capability - To mask and detect the loss of any one connection between gate circuits. Systems and Computers in Japan, 34(11):67-80, 2003. [doi]

This author has not been identified. Look up 'Masakatsu Nishigaki' in GoogleThis author has not been identified. Look up 'Makoto Nakano' in GoogleThis author has not been identified. Look up 'Masakazu Soga' in Google

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