Masakatsu Nishigaki, Makoto Nakano, Masakazu Soga. A fault-tolerant combinational circuit with fault diagnosis capability - To mask and detect the loss of any one connection between gate circuits. Systems and Computers in Japan, 34(11):67-80, 2003. [doi]
@article{NishigakiNS03,
title = {A fault-tolerant combinational circuit with fault diagnosis capability - To mask and detect the loss of any one connection between gate circuits},
author = {Masakatsu Nishigaki and Makoto Nakano and Masakazu Soga},
year = {2003},
doi = {10.1002/scj.10081},
url = {http://dx.doi.org/10.1002/scj.10081},
researchr = {https://researchr.org/publication/NishigakiNS03},
cites = {0},
citedby = {0},
journal = {Systems and Computers in Japan},
volume = {34},
number = {11},
pages = {67-80},
}