Yuki Nishiguchi, Ai Yano, Takeshi Ohtani, Ryuichi Matsukura, Jun Kakuta. IoT fault management platform with device virtualization. In 4th IEEE World Forum on Internet of Things, WF-IoT 2018, Singapore, February 5-8, 2018. pages 257-262, IEEE, 2018. [doi]
Abstract is missing.