x-passivated n-type crystalline-silicon substrates caused by potential-induced degradation and recovery tests

Naoyuki Nishikawa, Seira Yamaguchi, Keisuke Ohdaira. x-passivated n-type crystalline-silicon substrates caused by potential-induced degradation and recovery tests. Microelectronics Reliability, 79:91-95, 2017. [doi]

Abstract

Abstract is missing.