Yoshihito Nishizaki, Osamu Nakayama, Chiaki Matsumoto, Yoshitaka Kimura, Toshimi Kobayashi, Hiroyuki Nakamura. Testing DSM ASIC With Static, /DeltaIDDQ, And Dynamic Test Suite: Implementation And Results. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 85-94, IEEE Computer Society, 2003. [doi]
Abstract is missing.