Capacitance Measurement of Running Hardware Devices and its Application to Malicious Modification Detection - researchr publication authors

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Makoto Nishizawa, Kento Hasegawa, Nozomu Togawa. Capacitance Measurement of Running Hardware Devices and its Application to Malicious Modification Detection. In 2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018, Chengdu, China, October 26-30, 2018. pages 362-365, IEEE, 2018. [doi]

This author has not been identified. Look up 'Makoto Nishizawa' in GoogleThis author has not been identified. Look up 'Kento Hasegawa' in GoogleThis author has not been identified. Look up 'Nozomu Togawa' in Google

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