Makoto Nishizawa, Kento Hasegawa, Nozomu Togawa. Capacitance Measurement of Running Hardware Devices and its Application to Malicious Modification Detection. In 2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018, Chengdu, China, October 26-30, 2018. pages 362-365, IEEE, 2018. [doi]
Abstract is missing.