A New Refractive Index Sensor Based on Enhanced Surface Field of Zero-Admittance Layer in Dielectric Multi-Layers

D. Niu, A. L. Lereu, Myriam Zerrad, A. Moreau, F. Lemarchand, J. Lumeau, V. Aubry, A. Passian, J. A. Zapien, Claude Amra. A New Refractive Index Sensor Based on Enhanced Surface Field of Zero-Admittance Layer in Dielectric Multi-Layers. In 22nd International Conference on Transparent Optical Networks, ICTON 2020, Bari, Italy, July 19-23, 2020. pages 1, IEEE, 2020. [doi]

Authors

D. Niu

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A. L. Lereu

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Myriam Zerrad

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A. Moreau

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F. Lemarchand

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J. Lumeau

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V. Aubry

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A. Passian

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J. A. Zapien

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Claude Amra

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