D. Niu, A. L. Lereu, Myriam Zerrad, A. Moreau, F. Lemarchand, J. Lumeau, V. Aubry, A. Passian, J. A. Zapien, Claude Amra. A New Refractive Index Sensor Based on Enhanced Surface Field of Zero-Admittance Layer in Dielectric Multi-Layers. In 22nd International Conference on Transparent Optical Networks, ICTON 2020, Bari, Italy, July 19-23, 2020. pages 1, IEEE, 2020. [doi]
@inproceedings{NiuLZMLLAPZA20,
title = {A New Refractive Index Sensor Based on Enhanced Surface Field of Zero-Admittance Layer in Dielectric Multi-Layers},
author = {D. Niu and A. L. Lereu and Myriam Zerrad and A. Moreau and F. Lemarchand and J. Lumeau and V. Aubry and A. Passian and J. A. Zapien and Claude Amra},
year = {2020},
doi = {10.1109/ICTON51198.2020.9203517},
url = {https://doi.org/10.1109/ICTON51198.2020.9203517},
researchr = {https://researchr.org/publication/NiuLZMLLAPZA20},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {22nd International Conference on Transparent Optical Networks, ICTON 2020, Bari, Italy, July 19-23, 2020},
publisher = {IEEE},
isbn = {978-1-7281-8423-4},
}