Yunfan Niu, Jiarui Mo, Alexander May 0004, Mathias Rommel, Chiara Rossi, Joost Romijn, Guoqi Zhang, Sten Vollebregt. Design and Characterization of a Data Converter in a SiC CMOS Technology for Harsh Environment Sensing Applications. In 2023 IEEE SENSORS, Vienna, Austria, October 29 - Nov. 1, 2023. pages 1-4, IEEE, 2023. [doi]
Abstract is missing.