A comprehensive solution for electronic packages' reliability assessment with digital image correlation (DIC) method

Yuling Niu, Jing Wang, Shuai Shao 0002, Huayan Wang, Hohyung Lee, SeungBae Park. A comprehensive solution for electronic packages' reliability assessment with digital image correlation (DIC) method. Microelectronics Reliability, 87:81-88, 2018. [doi]

Authors

Yuling Niu

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Jing Wang

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Shuai Shao 0002

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Huayan Wang

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Hohyung Lee

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SeungBae Park

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