David J. Niven, Simon J. Mahon, Andrew J. Jones, Melissa C. Gorman. Transient Field-Plate Thermometry in Cascode FET Power Amplifiers. In IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2023, Monterey, CA, USA, October 16-18, 2023. pages 82-85, IEEE, 2023. [doi]
@inproceedings{NivenMJG23,
title = {Transient Field-Plate Thermometry in Cascode FET Power Amplifiers},
author = {David J. Niven and Simon J. Mahon and Andrew J. Jones and Melissa C. Gorman},
year = {2023},
doi = {10.1109/BCICTS54660.2023.10310968},
url = {https://doi.org/10.1109/BCICTS54660.2023.10310968},
researchr = {https://researchr.org/publication/NivenMJG23},
cites = {0},
citedby = {0},
pages = {82-85},
booktitle = {IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2023, Monterey, CA, USA, October 16-18, 2023},
publisher = {IEEE},
isbn = {979-8-3503-0764-1},
}