Atsumi Niwa, Futa Mochizuki, Raphael Berner, Takuya Maruyarma, Toshio Terano, Kenichi Takamiya, Yasutaka Kimura, Kyoji Mizoguchi, Takahiro Miyazaki, Shun Kaizu, Hirotsugu Takahashi, Atsushi Suzuki, Christian Brandli, Hayato Wakabayashi, Yusuke Oike. A 2.97μm-Pitch Event-Based Vision Sensor with Shared Pixel Front-End Circuitry and Low-Noise Intensity Readout Mode. In IEEE International Solid- State Circuits Conference, ISSCC 2023, San Francisco, CA, USA, February 19-23, 2023. pages 94-95, IEEE, 2023. [doi]
@inproceedings{NiwaMBMTTKMMKTSBWO23,
title = {A 2.97μm-Pitch Event-Based Vision Sensor with Shared Pixel Front-End Circuitry and Low-Noise Intensity Readout Mode},
author = {Atsumi Niwa and Futa Mochizuki and Raphael Berner and Takuya Maruyarma and Toshio Terano and Kenichi Takamiya and Yasutaka Kimura and Kyoji Mizoguchi and Takahiro Miyazaki and Shun Kaizu and Hirotsugu Takahashi and Atsushi Suzuki and Christian Brandli and Hayato Wakabayashi and Yusuke Oike},
year = {2023},
doi = {10.1109/ISSCC42615.2023.10067566},
url = {https://doi.org/10.1109/ISSCC42615.2023.10067566},
researchr = {https://researchr.org/publication/NiwaMBMTTKMMKTSBWO23},
cites = {0},
citedby = {0},
pages = {94-95},
booktitle = {IEEE International Solid- State Circuits Conference, ISSCC 2023, San Francisco, CA, USA, February 19-23, 2023},
publisher = {IEEE},
isbn = {978-1-6654-9016-0},
}