Charles Njinda, Neeraj Kaul. Performance Driven BIST Technique for Random Logic. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 524-533, IEEE Computer Society, 1995.
@inproceedings{NjindaK95,
title = {Performance Driven BIST Technique for Random Logic},
author = {Charles Njinda and Neeraj Kaul},
year = {1995},
tags = {logic},
researchr = {https://researchr.org/publication/NjindaK95},
cites = {0},
citedby = {0},
pages = {524-533},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}