Keita Noguchi, Yosuke Kobayashi, Jay Kishigami, Kiyohiro Kurisu. Listening Difficulty Rating Meter Using Machine Learning for Assessing Public-Address Systems. In IEEE 7th Global Conference on Consumer Electronics, GCCE 2018, Nara, Japan, October 9-12, 2018. pages 501-502, IEEE, 2018. [doi]
@inproceedings{NoguchiKKK18,
title = {Listening Difficulty Rating Meter Using Machine Learning for Assessing Public-Address Systems},
author = {Keita Noguchi and Yosuke Kobayashi and Jay Kishigami and Kiyohiro Kurisu},
year = {2018},
doi = {10.1109/GCCE.2018.8574812},
url = {https://doi.org/10.1109/GCCE.2018.8574812},
researchr = {https://researchr.org/publication/NoguchiKKK18},
cites = {0},
citedby = {0},
pages = {501-502},
booktitle = {IEEE 7th Global Conference on Consumer Electronics, GCCE 2018, Nara, Japan, October 9-12, 2018},
publisher = {IEEE},
isbn = {978-1-5386-6309-7},
}