Keita Noguchi, Yosuke Kobayashi, Jay Kishigami, Kiyohiro Kurisu. Listening Difficulty Rating Meter Using Machine Learning for Assessing Public-Address Systems. In IEEE 7th Global Conference on Consumer Electronics, GCCE 2018, Nara, Japan, October 9-12, 2018. pages 501-502, IEEE, 2018. [doi]