Mateus Schulz Nogueira, Erica da Cunha Ferreira, Pedro Tubenchlak Boechat, Felipe Assis, Estevão Rabello Ussler, Rafael Rodrigo Furtado do Nascimento, Daniel Sadoc Menasché, Geraldo Xexéo, Abhishek Ramchandran, Katinka Wolter. A Large Scale Characterization of Device Uptimes. IEEE Trans. Emerging Topics Comput., 11(3):553-565, July - September 2023. [doi]
Abstract is missing.