High-Fidelity Beam Selection in the Upper Mid-Band Using Digital Twin Ray-Tracing and Deep Learning

Hyunseok Noh, Taeje Park, Wonjin Sung. High-Fidelity Beam Selection in the Upper Mid-Band Using Digital Twin Ray-Tracing and Deep Learning. In RIVF International Conference on Computing and Communication Technologies, RIVF 2025, Ho Chi Minh City, Vietnam, December 18-20, 2025. pages 48-53, IEEE, 2025. [doi]

Abstract

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