Brandon Noia, Krishnendu Chakrabarty. Testing and Design-for-Testability Techniques for 3D Integrated Circuits. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 474-479, IEEE Computer Society, 2011. [doi]
@inproceedings{NoiaC11a,
title = {Testing and Design-for-Testability Techniques for 3D Integrated Circuits},
author = {Brandon Noia and Krishnendu Chakrabarty},
year = {2011},
doi = {10.1109/ATS.2011.67},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2011.67},
researchr = {https://researchr.org/publication/NoiaC11a},
cites = {0},
citedby = {0},
pages = {474-479},
booktitle = {Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011},
publisher = {IEEE Computer Society},
isbn = {978-1-4577-1984-4},
}