Luc Noizette, Florent Miller, Thierry Colladant, Youri Helen, Régis Leveugle. Using Application Profiling based on a Virtual Platform for SoC Fault Tolerance Assessment. In 17th Conference on Ph.D Research in Microelectronics and Electronics, PRIME 2022, Villasimius, SU, Italy, June 12-15, 2022. pages 225-228, IEEE, 2022. [doi]
Abstract is missing.