Ryo Nomura, Hideki Yagi. Optimum Source Resolvability Rate with Respect to f-Divergences Using the Smooth Rényi Entropy. In IEEE International Symposium on Information Theory, ISIT 2020, Los Angeles, CA, USA, June 21-26, 2020. pages 2286-2291, IEEE, 2020. [doi]
@inproceedings{NomuraY20, title = {Optimum Source Resolvability Rate with Respect to f-Divergences Using the Smooth Rényi Entropy}, author = {Ryo Nomura and Hideki Yagi}, year = {2020}, doi = {10.1109/ISIT44484.2020.9174531}, url = {https://doi.org/10.1109/ISIT44484.2020.9174531}, researchr = {https://researchr.org/publication/NomuraY20}, cites = {0}, citedby = {0}, pages = {2286-2291}, booktitle = {IEEE International Symposium on Information Theory, ISIT 2020, Los Angeles, CA, USA, June 21-26, 2020}, publisher = {IEEE}, isbn = {978-1-7281-6432-8}, }